Year |
Title |
Auther |
Journal/Vol. |
2006 |
Vacancy-impurity complexes in polycrystalline Si used as gate electrodes of HfSiON-based metal-oxide-semiconductors probed using monoenergetic positron beams |
A. Uedono, K. Ikeuchi, T. Otsuka, K. Yamabe, K. Eguchi, M. Takayanagi, S. Ishibashi, T. Ohdaira, M. Muramatsu, and R. Suzuki |
J. Appl. Phys. 100, 034509 (2006) |
2006 |
Improvements in quantum efficiency of excitonic emissions in ZnO epilayers by the elimination of point defects |
S. F. Chichibu, T. Onuma, M. Kubota, A. Uedono, T. Sota, A. Tsukazaki, A. Ohtomo, and M. Kawasaki |
J. Appl. Phys. 99, 093505 (2006) |
2006 |
Characterization of HfSiON gate dielectrics using monoenergetic positron beams |
A. Uedono, K. Ikeuchi, T. Otsuka, K. Shiraishi, and K. Yamabe ,S. Miyazaki ,N. Umezawa, A. Hamid, T. Chikyow ,T. Ohdaira M. Muramatsu , R. Suzuki ,S. Inumiya, S. Kamiyama, Y. Akasaka, Y. Nara ,K. Yamada |
J. Appl. Phys. 99, 054507 (2006) |
2005 |
Defects introduced into electroplated Cu films during room-temperature recrystallization probed by a monoenergetic positron beam |
A. Uedono, T. Suzuki, T. Nakamura, T. Ohdaira and R. Suzuki |
J. Appl. Phys. 98, 043504 (2005). |
2005 |
Annealing properties of open volumes in HfSiOx and HfAlOx gate dielectrics studied using monoenergetic positron beams |
A. Uedono, K. Ikeuchi, K. Yamabe, T. Ohdaira, M. Muramatsu, R. Suzuki, A.S. Hamid, T. Chikyow, K. Torii, and K. Yamada |
J. Appl. Phys. 98, 023506 (2005). |
2005 |
Improvement of crystal quality of GaInNAs films grown by atomic hydrogen-assisted RF-MBE |
Y. Shimizu, N. Kobayashi, A. Uedono and Y. Okada |
J. Cryst. Growth 278, 553-557 (2005). |
2005 |
Exciton-polariton spectra and limiting factors for the room-temperature photoluminescence efficiency in ZnO |
S. F. Chichibu, A. Uedono, A. Tsukazaki, T. Onuma, M. Zamfirescu, A. Ohtomo, A. Kavokin, G. Gantwell, C. W. Litton, T. Sota and M. Kawasaki |
Semiconductor Science and Technology 20, S67-S77 |
2005 |
Vacancy-type defects in Si-doped InN grown by plasma-assisted molecular beam epitaxy probed using monoenergetic positron beams |
A. Uedono, S. F. Chichibu, M. Higashiwaki, T. Matsui, T. Ohdaira and R. Suzuki |
J. Appl. Phys. 97, 43514-1 - 43514-5 |
2005 |
Suppression of oxygen diffusion by thin Al2O3 films grown on SrTiO3 studied using a monoenergetic positron beam |
A. Uedono, M. Kiyohara, N. Yasui and K. Yamabe |
J. Appl. Phys. 97, 33508-1 - 33508-5 |
2005 |
Vacancy-type defects in strained Si layers deposited on SiGe/Si structures probed by using monoenergetic positron beams |
A. Uedono, N. Hattori, H. Naruoka, S. Ishibashi, R. Suzuki and T. Ohdaira |
J. Appl. Phys. 97, 23532-1 - 23532-5 |
2004 |
Reduction of point defect density in cubic GaN Epilayers on (001) GaAs substrates using AlxGa1-xN/GaN superlattice under layers |
S.F. Chichibu, M. Sugiyama, T. Nozaka, T. Suzuki, T. Onuma, K. Nakajima, T. Aoyama, M. Sumiya, T. Chikyow and A. Uedono |
J. Crystal Growth 272, 481-488 |
2004 |
Characterization of Hf0.3Al0.7Ox fabricated by atomic-layer-deposition technique using monoenergetic positron beams |
A. Uedono, M. Goto, K. Higuchi1, K. Shiraish, K. Yamabe, H. Kitajima, R. Mitsuhashi, A. Horiuchi, K. Torii, T. Arikado R. Suzuki, T. Ohdaira and K. Yamada |
Jpn. J. Appl. Phys. 43, 7848-7852 |
2004 |
Characterizing metal-oxide-semiconductor structures consisting of HfSiOx as gate dielectrics using monoenergetic positron beams |
A. Uedono, N. Hattori, A. Ogura, J. Kudo, S. Nishikawa, T. Ohdaira, R. Suzuki and T. Mikado |
Jpn. J. Appl. Phys. 43, 1254-1259 |
2004 |
Direct comparison of photoluminescence lifetime and defect densities in ZnO epilayers studied by time-resolved photoluminescence and slow positron annihilation techniques |
T.Koida, A.Uedono, A.Tsukazaki, T.Sota, M.Kawasaki, and S.F.Chichibu |
Physica Status Solidi (a) 201, pp.2841-2845 |
2004 |
Vacancy-Type Defects in Electroplated Cu Films Probed by Using a Monoenergetic Positron Beam |
A. Uedono, T. Suzuki and T. Nakamura |
J. Appl. Phys. 95, 913-917 |
2004 |
Reduced Defect Densities in Cubic GaN Epilayers with AlGaN/GaN Superlattice Underlayers Grown on (001) GaAs Substrate by Metalorganic Vapor Phase Epitaxy |
M. Sugiyama, T. Nosaka, T. Suzuki, T. Koida, K. Nakajima, T. Aoyama, M. Sumiya, T. Chikyow, A. Uedono, S. F. Chichibu |
Jpn. J. Appl. Phys. 43, 958-965 |
2004 |
Radiative and Nonradiative Processes in Strain-Free AlxGa1-xN Films Studied by Time-Resolved Photoluminescence and Positron Annihilation Techniques |
T. Onuma, S. F. Chichibu, A. Uedono, T. Sota, P. Cantu, T. M. Katona, J. F. Keading S. Keller, U. K. Mishra, S. Nakamura and S. P. DenBaars |
J. Appl. Phys. 95, 2495-2504 |
2004 |
Characterization of photoresists for ArF-excimer laser lithography using monoenergetic positron beams |
A. Uedono, T. Ohdaira, R. Suzuki, T. Mikado, S. Fukui, S. Kimura, H. Miyamoto and H. Nemoto |
J. Polym. Sci. B 42, 341-346 |
2003 |
Defects Introduced into SrTiO3 by Auto-Feeding-Epitaxy Studied Using Positron Annihilation Technique |
A. Uedono, M. Kiyohara, K. Shimoyama, K. Yamabe, T. Ohdaira, R. Suzuki and T. Mikado |
Mat. Sci. in Semicond. Processing 6, 367-369 |
2003 |
Defects in CeO2/SrTiO3 fabricated by automatic feeding epitaxy probed using positron annihilation |
A. Uedono, K. Shimoyama, M. Kiyohara and K. Yamabe |
J. Appl. Phys. 94, 5193-5198 |
2003 |
Improvement of Hydrogen Absorption Rate of Pd by Ion Implantation |
H. Abe, H. Uchida, Y. Azuma, A. Uedono, Z.Q. Chen and H. Ito |
Nucl. Inst. & Methods B 206, 224-227 |
2003 |
Defects in Eu- and Tb-doped GaN Probed Using a Monoenergetic Positron Beam |
A. Uedono, H. Bang, K. Horibe, S. Morishima and K. Akimoto
|
J. Appl. Phys. 93, 5181-5184 |
2003 |
Hydrogen-Terminated Defects in Ion-Implanted Silicon Probed by Monoenergetic Positron Beams |
A. Uedono, T. Mori, K. Morisawa, K. Murakami, T. Ohdaira, R. Suzuki, T. Mikado, K. Ishioka, M. Kitajima, S. Hishita, H. Haneda and I. Sakaguchi |
J. Appl. Phys. 93, 3228-3234 |
2003 |
Defects in ZnO Thin Films Grown on ScAlMgO4 Substrates Probed by a Monoenergetic Positron Beam |
A. Uedono, T. Koida, A. Tsukazaki, M. Kawasaki, Z.Q. Chen, SF. Chichibu and H. Koinuma
|
J. Appl. Phys. 93, 2481-2485 |
2003 |
Positron Annihilation Study of Free Volume Holes in Polymers and Polymer Blends |
Z.Q. Chen, A. Uedono, T. Suzuki and J.S. He
|
J. Radioanalytical and Nuclear Chemistry 255, 291-294 |
2002 |
Epitaxial Growth of BaTiO3/SrTiO3 Structures on SrTiO3 Substrate with Automatic Feeding of Oxygen from the Substrate |
K. Shimoyama, M. Kiyohara, K. Yamabe and A. Uedono |
J. Appl. Phys. 92, 4625-4630 |
2002 |
Study of Oxygen Vacancies in SrTiO3 by Positron Annihilation |
A. Uedono, K. Shimayama, M. Kiyohara, Z.Q. Chen and K. Yamabe
|
J. Appl. Phys. 92, 2697-2702 |
2002 |
Oxygen-Related Defects and Their Annealing Behavior in Low-Dose Separation-by-Implanted Oxygen (SIMOX) Wafers Studied by Slow Positron Beams |
Z.Q. Chen, A. Uedono, A. Ogura, H. Ono, R. Suzuki, T. Ohdaira and T. Mikado
|
Appl. Surf. Sci. 194, 112-115 |
2002 |
Positron Annihilation in SiO2-Si Studied by a Pulsed Slow Positron Beam |
R. Suzuki, T. Ohdaira, A. Uedono and Y. Kobayashi
|
Appl. Surf. Sci. 194, 89-96 |
2002 |
Defects-Induced Volume Deviations in ZnSe |
H. Ebe, Z.Q. Chen, A. Uedono, B.P. Zhang, Y. Segawa, K. Suto, and J. Nishizawa |
J. Cryst. Growth 237, 1566-1569 |
2002 |
Defects in Silicon-on-Insulator Wafers and their hydrogen interaction Studied by Monoenergetic Positron Beams |
A. Uedono, Z.Q. Chen, A. Ogura, R. Suzuki, T. Ohdaira and T. Mikado
|
J. Appl. Phys. 91, 6488-6492 |
2002 |
Compatibilization of Metallocene Polyethylene/Polyamide Blends with Maleic Anhydride Studied by Positron Annihilation |
Z.Q. Chen, A. Uedono, Y.Y. Li and J.S. He
|
Jpn. J. Appl. Phys. 41, 2146-2149 |
2001 |
Vacancy-Type Defects in BaTiO3/SrTiO3 Structures Probed by Monoenergetic Positron Beams |
A. Uedono, K. Shimoyama, M. Kiyohara, Z.Q. Chen, K. Yamabe, R. Suzuki, T. Ohdaira and T. Mikado
|
J. Appl. Phys. 91, 5307-5312 |
2001 |
Oxygen-Related Defects in Low-Dose Separation-by-implanted Oxygen Wafers Probed by Monoenergetic Positron Beams |
A. Uedono, Z.Q. Chen, A. Ogura, H. Ono, R. Suzuki, T. Ohdaira and T. Mikado
|
J. Appl. Phys. 90, 6026-6031 |
2001 |
Nanoporous Structure of Methyl-Silsesquioxane Films Using Monoenergetic Positron Beams |
A. Uedono, Z.Q. Chen, R. Suzuki, T. Ohdaira, T. Mikado, S. Fukui, A. Shiota and S. Kimura |
J. Appl. Phys. 90, 2498-2503 |
2001 |
Free Volume in Polycarbonate Studied by Positron Annihilation: Effects of Free Radicals and Trapped Electrons on Positronium Formation |
Z.Q. Chen, T. Suzuki, K. Kondo, A. Uedono and Y. Ito
|
Jpn. J. Appl. Phys. 40, 5036-5040 |
2001 |
Study of Defects in GaN Grown by the Two-Flow Metalorganic Chemical Vapor Deposition Technique Using Monoenergetic Positron Beams |
A. Uedono, S.F. Chichibu, Z.Q. Chen, M. Sumiya, R. Suzuki, T. Ohdaira, T. Mikado, T. Mukai and S. Nakamura
|
J. Appl. Phys. 90, 181-186 |
2001 |
Evaluation of SOI Substrates by Positron Annihilation |
A. Uedono, A. Ogura and S. Tanigawa
|
Jpn. J. Appl. Phys. 40, 2903-2906 |
2001 |
A Study of Vacancy-Type Defects Introduced by the Carburization of Si by Monoenergetic Positron Beams |
A. Uedono, M. Muramatsu, T. Ubukata, M. Watanabe, T. Ichihashi, R. Suzuki, T. Ohdaira, T. Mikado and S. Takasu |
J. Appl. Phys. 89, 3606-3610 |
2001 |
Open Spaces and Molecular Motions in Carbon-Black- and Silica-Loaded SBR Investigated Using Positron Annihilation |
A. Uedono, S. Fukui, M. Muramatsu, T. Ubukata, S. Kimura and S. Tanigawa
|
J. Polym. Sci. B 39, 835-842 |
2000 |
Low Temperature Buffer Growth for Modulation Doped SiGe/Ge/SiGe Heterostructures with High Hole Mobility |
T. Ueno, T. Irisawa, Y. Shiraki, A. Uedono and S. Tanigawa
|
Thin Solid Films 369, 320-323 |
2000 |
Oxygen-Related Defects Introduced by As+-Implantation through Cap Layers in Si Probed by Monoenergetic Positron Beams |
A. Uedono, M. Muramatsu, T. Ubukata, H. Tanino, S. Tanigawa, A. Nakano, H. Yamamoto, R. Suzuki, T. Ohdaira and T. Mikado
|
Jpn. J. Appl. Phys. 39, 6126-6129 |
2000 |
Crystallization of an Amorphous Layer in P+-implanted 6H-SiC Studied by Monoenergetic Positron Beams |
A. Uedono, S. Tanigawa, T. Ohshima, H. Itoh, M. Yoshikawa, I. Nashiyama, T. Frank, G. Pensl, R. Suzuki, T. Ohdaira and T. Mikado |
J. Appl. Phys. 87, 4119-4125 |
2000 |
Annealing Properties of Defects During Si-on-Insulator Fabrication by Low-Dose Oxygen Implantation Studied by Monoenergetic Positron Beams |
A. Uedono, S. Tanigawa, A. Ogura, H. Ono, R. Suzuki, T. Ohdaira and T. Mikado
|
J. Appl. Phys. 87, 1659-1665 |
2000 |
Positron Annihilation in Silicon in Thermal Equilibrium at High Temperature |
A. Uedono, M. Watanabe, S. Takasu, T. Sabato and S. Tanigawa
|
J. Phys. Condens. Matter. 12, 719-728 |
2000 |
Open Spaces and Relaxation Processes in the Subsurface Region of Polypropylene Probed by Monoenergetic Positron Beams |
A. Uedono, R. Suzuki, T. Ohdaira, T. Mikado, S. Tanigawa, M. Ban, M. Kyoto and T. Uozumi
|
J. Polym. Sci. B 38, 101-107 |
1999 |
Oxygen-Related Defects in O+-implanted 6H-SiC Studied by a Monoenergetic Positron Beam |
A. Uedono, S. Tanigawa, T. Ohshima, H. Itoh, Y. Aoki, M. Yoshikawa and I. Nashiyama
|
J. Appl. Phys. 86, 5392-5398 |
1999 |
Defects in p+-Gate Metal-Oxide-Semiconductor Structures Probed by Monoenergetic Positron Beams |
A. Uedono, M. Hiketa, S. Tanigawa, T. Kitano, T. Kubota, M. Makabe, R. Suzuki, T. Ohdaira and T. Mikado |
J. Appl. Phys. 86, 5385-5391 |
1999 |
Open Spaces and Molecular Motions of Acrylic Epoxy Based Network Polymers Probed by Positron Annihilation |
A. Uedono, W. Aiko, Y. Yamamoto, T. Nakamichi and S. Tanigawa
|
J. Polym. Sci. B 37, 2875-2880 |
1999 |
Annealing Behaviors of Defects in Electron Irradiated Diamond Probed by Positron Annihilation |
A. Uedono, K. Mori, N. Morishita, H. Itoh, S. Tanigawa S. Fujii and S. Shikata |
J. Phys. Condens. Matter. 11, 4925-4934 |
1999 |
Defects in Synthesized and Natural Diamond Probed by Positron Annihilation |
A. Uedono, S. Fujii, N. Morishita, H. Itoh, S. Tanigawa and S. Shikata
|
J. Phys. Condens. Matter. 11, 4109-4122 |
1998 |
Characterization of Vacancy-Type Defects and Phosphorus-Donors Introduced in 6H-SiC by Ion Implantation |
T. Ohshima, A. Uedono, K. Abe, H. Itoh, Y. Aoki, M. Yoshikawa, S. Tanigawa and I. Nashiyama |
Appl. Phys. A 67, 407-412 |
1998 |
Investigation of Positron Moderator Materials for Electron-Linac-Based Slow Positron Beamlines |
R. Suzuki, T. Ohdaira, A. Uedono, Y.K. Cho, S. Yoshida, Y. Ishida, T. Ohshima, H. Itoh, M. Chiwaki, T. Mikado, T. Yamazaki and S. Tanigawa |
Jpn. J. Appl. Phys. 37, 4636-4643 |
1998 |
Open Spaces and Molecular Motions of Polyether-Based Network Polymers Probed by Positron Annihilation |
A. Uedono, S. Tanigawa, M. Watanabe and A. Nishimoto
|
J. Polym. Sci. B 36, 1919-1925 |
1998 |
Defects in Ion Implanted Hg0.78Cd0.22Te Probed by Monoenergetic Positron Beams |
A. Uedono, H. Ebe, M. Tanaka, R. Suzuki, T. Ohdaira, S. Tanigawa, T. Mikado, K. Yamamoto and Y. Miyamoto |
Jpn. J. Appl. Phys. 37, 3910-3914 |
1998 |
Investigation of Vacancy-Type Defects in P+-Implanted 6H-SiC by Monoenergetic Positron Beams |
A. Uedono, T. Ohshima, H. Itoh, R. Suzuki, T. Ohdaira, S. Tanigawa, Y. Aoki, M. Yoshikawa, I. Nashiyama and T. Mikado
|
Jpn. J. Appl. Phys. 37, 2422-2429 |
1998 |
Defects and Their Annealing Properties in B+-Implanted Hg0.78Cd0.22Te Studied by Positron Annihilation |
A. Uedono, H. Ebe, M. Tanaka, S. Tanigawa, K. Yamamoto and Y. Miyamoto
|
Jpn. J. Appl. Phys. 37, 786-791 |
1997 |
Evidence for Formation of n+-GaAs layer in Pd/Ge ohmic contact to n-type GaAs |
J.-L. Lee, Y.-T. Kim, J.S. Kwak, H.K. Baik, A. Uedono and S. Tanigawa |
J. Appl. Phys. 82, 5460-5464 |
1997 |
Characterization of Residual Defects in Cubic Silicon Carbide Subjected to Hot-Implantation and Subsequent Annealing |
H. Itoh, T. Ohshima, Y. Aoki, K. Abe, M. Yoshikawa, I. Nashiyama, H. Okumura, S. Yoshida, A. Uedono and S. Tanigawa
|
J. Appl. Phys. 82, 5339-5347 |
1997 |
A Study of Native Defects in Ag-doped HgCdTe by Positron Annihilation |
A. Uedono, K. Ozaki, H. Ebe, T. Moriya, S. Tanigawa, K. Yamamoto and Y. Miyamoto
|
Jpn. J. Appl. Phys. 36, 6661-6667 |
1997 |
Annealing Properties of Defects in Ion-Implanted 3C-SiC Studied Using Monoenergetic Positron Beams |
A. Uedono, H. Itoh, T. Ohshima, R. Suzuki, T. Ohdaira, S. Tanigawa, Y. Aoki, M. Yoshikawa, I. Nashiyama, T. Mikado, H. Okumura and S. Yoshida |
Jpn. J. Appl. Phys. 36, 6650-6660 |
1997 |
Positron Annihilation Studies of Defects in 3C-SiC Hot-Implanted with Nitrogen and Aluminum Ions |
H. Itoh, A. Uedono, T. Ohshima, Y. Aoki, M. Yoshikawa, I. Nashiyama, S. Tanigawa, H. Okumura and S. Yoshida |
Appl. Phys. A 65, 315-323 |
1997 |
Transition and Relaxation Processes of Polyethylene, Polypropylene, and Polystyrene Studied by Positron Annihilation |
A. Uedono, T. Kawano, S. Tanigawa, M. Ban, M. Kyoto and T. Uozumi
|
J. Polym. Sci. B 35, 1601-1609 |
1997 |
Defects in the Ti/GaAs System Probed by Monoenergetic Positron Beams |
A. Uedono, S. Fujii, T. Moriya, T. Kawano, S. Tanigawa, R. Suzuki, T. Ohdaira and T. Mikado
|
J. Phys. Condens. Matter 9, 6827-6835 |
1997 |
Annealing Properties of Defects in B+- and F+-Implanted Si Studied Using Monoenergetic Positron Beams |
A. Uedono, T. Kitano, K. Hamada, T. Moriya, T. Kawano, S. Tanigawa, R. Suzuki, T. Ohdaira and T. Mikado
|
Jpn. J. Appl. Phys. 36, 2571-2580 |
1997 |
Fluorine-Related Defects in BF2+-Implanted Si Probed by Monoenergetic Positron Beams |
A. Uedono, T. Kitano, M. Watanabe, T. Moriya, N. Komuro, T. Kawano, S. Tanigawa, R. Suzuki, T. Ohdaira and T. Mikado
|
Jpn. J. Appl. Phys. 36, 969-974 |
1996 |
Defects in Ion Implanted 3C-SiC Probed by a Monoenergetic Positron Beam |
A. Uedono, H. Itoh, T. Ohshima, Y. Aoki, M. Yoshikawa, I. Nashiyama, H. Okumura, S. Yoshida, T. Moriya, T. Kawano and S. Tanigawa |
Jpn. J. Appl. Phys. 35, 5986-5900 |
1996 |
Annihilation of Positronium in $B&A(J-SiO2 Investigated by Combined Angular Correlation and Lifetime Measurements |
S. Dannefaer, T. Friessnegg, D. Kerr, A. Uedono, X. Li and S. Tanigawa
|
Phys. Rev. B 54, 15051-15055 |
1996 |
$BM[EE;R>CLG$K$h$k9bJ,;R$N%,%i%9E>0\$H4KOB8=>]$N8!=P(J |
$B>eEBL@NI(J, $BC+@n>10lO:(J
|
$B9bJ,;RO@J8=8(J 53, 563-574 |
1996 |
Study of Relaxation Processes in Polyethylene and Polystyrene by Positron Annihilation |
A. Uedono, T. Kawano, S. Tanigawa, M. Ban, M. Kyoto and T. Uozumi
|
J. Polym. Sci. B 34, 2145-2151 |
1996 |
Free Volumes in Nematic and Smectic Liquid-Crystalline Polymers Probed by Positron Annihilation |
R. Sadamoto, A. Uedono, T. Kawano, S. Tanigawa, Y. Kosaka, T. Uryu
|
J. Polym. Sci. B 34, 1659-1664 |
1996 |
Thermal Equilibrium Defects in Anthracene Probed by Positron Annihilation |
A. Uedono, M. Tachibana, M. Shimizu, M. Satoh, K. Kojima, S. Ishibashi, T. Kawano and S. Tanigawa |
Jpn. J. Appl. Phys. 35, 3623-3629 |
1996 |
Free Volumes in Polystyrene Probed by Positron Annihilation |
M. Ban, M. Kyoto, A. Uedono, T. Kawano and S. Tanigawa
|
J. Polym. Sci. B 34, 1189-1195 |
1996 |
Effects of Recoil-Implanted Oxygen on Depth Profiles of Defects and Annealing Processes in P+-Implanted Si Studied Using Monoenergetic Positron Beams |
A. Uedono, T. Kitano, M. Watanabe, T. Moriya, T. Kawano, S. Tanigawa, R. Suzuki, T. Ohdaira and T. Mikado |
Jpn. J. Appl. Phys. 35, 2000-2007 |
1995 |
A Positron Age-Momentum Correlation Spectrometer for the Study of Open Spaces in Amorphous Polymers |
A. Uedono, T. Kawano, S. Tanigawa, M. Ban and M. Kyoto
|
Nucl. Inst. & Methods B 103, 511-516 |
1995 |
Formation of Oxygen-Related Defects Enhanced by Fluorine in BF2+-Implanted Si Studied by Monoenergetic Positron Beam |
A. Uedono, T. Moriya, T. Kawano, S. Tanigawa, R. Nagai and K. Umeda
|
Jpn. J. Appl. Phys. 34, 6293-6297 |
1995 |
Characterization of Diamond Single Crystals by Means of Double-Crystal X-ray Diffraction and Positron Annihilation |
S. Fujii, Y. Nishibayashi, S. Shikata, A. Uedono and S. Tanigawa |
Appl. Phys. A 61, 331-333 |
1995 |
Defects in TiN Films Probed by Monoenergetic Positron Beam |
A. Uedono, S. Nanao, T. Moriya, S. Tanigawa, R. Suzuki, T. Ohdaira, T. Mikado and S. Ishibashi
|
Jpn. J. Appl. Phys. 34, 5711-5716 |
1995 |
Characterization of Metal/GaAs Interfaces by Monoenergetic Positron Beam |
A. Uedono, S. Fujii, T. Moriya, T. Kawano and S. Tanigawa |
Jpn. J. Appl. Phys. 34, 5505-5509 |
1995 |
Positronium Annihilation in SiO2/Si Structure at Low Temperature |
A. Uedono, T. Moriya, S. Tanigawa, T. Kawano and Y. Ohji
|
J. Appl. Phys. 78, 3269-3273 |
1995 |
Study of Various Types of Diamonds by Measurements of Double Crystal X-Ray Diffraction and Positron Annihilation |
S. Fujii, Y. Nishibayashi, S. Shikata, A. Uedono and S. Tanigawa |
J. Appl. Phys. 78, 1510-1513 |
1995 |
Thermal Variation of Free-Volumes Size Distribution in Polypropylenes Probed by Positron Annihilation Lifetime Technique |
Y. Ohko, A. Uedono and Y. Ujihira
|
J. Polym. Sci. B 33, 1183-1190 |
1995 |
Positron Trapping by Defects in Vitreous Silica at Low Temperature |
A. Uedono, T. Kawano, S. Tanigawa, A. Urano, M. Kyoto and H. Itoh
|
J. Phys. Condens. Matter 7, 5139-5149 |
1995 |
Free Volumes in Liquid-Crystalline Main-Chain Polymer Probed by Positron Annihilation |
A. Uedono, R. Sadamoto, T. Kawano, S. Tanigawa and T. Uryu
|
J. Polym. Sci. B 33, 891-897 |
1995 |
Vacancy-Type Defects in Ion-Implanted Diamonds Probed by Monoenergetic Positron Beams |
A. Uedono, T. Kawano, S. Tanigawa, R. Suzuki, T. Ohdaira, T. Mikado, S. Fujii and S. Shikata
|
Jpn. J. Appl. Phys. 34, 1772-1777 |
1994 |
Defects in Heavily Phosphorus-Doped Si Epitaxial Films Probed by Monoenergetic Positron Beam |
A. Uedono, S. Tanigawa, R. Suzuki, H. Ohgaki and T. Mikado
|
Jpn. J. Appl. Phys. 33, 6286-6290 |
1994 |
Application of Positron Age-Momentum Correlation Measurement to the Study of Defects in Electron Irradiated Synthetic Silica Glass |
S. Watauchi, A. Uedono and Y. Ujihira
|
J. Appl. Phys. 76, 4553-4559 |
1994 |
Defects in Czochralski-Grown Silicon Crystals Investigated by Positron Annihilation |
A. Ikari, K. Kawakami, H. Haga, A. Uedono, L. Wei, T. Kawano and S. Tanigawa
|
Jpn. J. Appl. Phys. 33, 5585-5589 |
1994 |
Defects in Electron Irradiated Vitreous SiO2 Probed by Positron Annihilation |
A. Uedono, T. Kawano, S. Tanigawa and H. Itoh
|
J. Phys. Condens. Matter 6, 8669-8677 |
1994 |
$BM[EE;R>CLG$K$h$kEE;R@~>H
$BLJBGIR;J(J, $B>eEBL@NI(J, $B0MED=$(J, $B;aJ?M4Je(J
|
$BF|K\2=3X2q2q;o(J 505-511 |
|
1994 |
Defects in SiO2/Si Structures Probed by Using a Monoenergetic Positron Beam |
A. Uedono, L. Wei, S. Tanigawa and Y. Ohji
|
Jpn. J. Appl. Phys. 33, 3330-3334 |
1994 |
Positronium Formation in SiO2 Films Grown on Si Substrates Studied by Monoenergetic Positron Beams |
A. Uedono, L. Wei, S. Tanigawa, R. Suzuki, H. Ohgaki, T. Mikado and Y. Ohji
|
J. Appl. Phys. 75, 3822-3828 |
1994 |
Oxygen Clusters in Quenched Czochralski-Si Studied by Infrared Spectroscopy and Positron Annihilation |
A. Ikari, H. Haga, A. Uedono, Y. Ujihira and O. Yoda
|
Jpn. J. Appl. Phys. 33, 1723-1727 |
1994 |
Vacancy-Type Defects in Be-implanted InP |
L. Wei, A. Uedono, S. Tanigawa, K. Wada and H. Nakanishi |
Jpn. J. Appl. Phys. 33, 33-36 |
1994 |
Positron Annihilation in Proton Irradiated Czochralski-Grown Si |
A. Uedono, Y.K. Cho, S. Tanigawa and A. Ikari
|
Jpn. J. Appl. Phys. 33, 1-5 |
1994 |
SiO2 films Deposited on Si Substrates by Monoenergetic Positron Beams |
A. Uedono, L. Wei, S. Tanigawa, R. Suzuki, H. Ohgaki, T. Mikado and K. Fujino
|
J. Appl. Phys. 75, 216-222 |
1993 |
Positron Annihilation in a Metal/Oxide/Semiconductor Studied by Using a Pulsed Monoenergetic Positron Beam |
A. Uedono, L. Wei, S. Tanigawa, R. Suzuki, H. Ohgaki, T. Mikado and Y. Ohji
|
J. Appl. Phys. 74, 7251-7256 |
1993 |
Characterization of Separation-by-Implanted-Oxygen Wafers with Monoenergetic Positron Beams |
A. Uedono, L. Wei, S. Tanigawa, R. Suzuki, H. Ohgaki, T. Mikado, H. Kametani, H. Akiyama, Y. Yamaguchi and M. Koumaru |
Jpn. J. Appl. Phys. 32, 3682-3686 |
1993 |
Positron Annihilation in Vitreous Silica Glasses |
A. Uedono and S. Tanigawa
|
Jpn. J. Appl. Phys. 32, 2687-2691 |
1993 |
Study of Point Defects in Bulk ZnSe Grown by Nonstoichiometric Annealing |
K. Terashima, E. Tokizaki, A. Uedono and Y. Ujihira
|
Jpn. J. Appl. Phys. 32, 736-740 |
1992 |
$BM[EE;R
$B>eEBL@NI(J, $BNkLZNI0l(J, $BC+@n>10lO:(J
|
Radioisotopes 41, 611-617 |
|
1992 |
Characterization of Diamond Films by Means of a Pulsed Positron Beam |
R. Suzuki, Y. Kobayashi, T. Mikado, H. Ohgaki, M. Chiwaki, T. Yamazaki, A. Uedono, S. Tanigawa and H. Funamoto |
Jpn. J. Appl. Phys. 31, 2237-2240 |
1992 |
Characterization of Grown-in Dislocations in Benzophenone Single Crystals by X-Ray Topography |
M. Tachibana, S. Motomura, A. Uedono, Q. Tang and K. Kojima
|
Jpn. J. Appl. Phys. 31, 2202-2205 |
1992 |
The Depth Profiles of Ion Implantation Induced Vacancy-Type Defects Probed by a Monoenergetic Positron Beam |
A. Uedono, L. Wei, S. Tanigawa, J. Sugiura, M. Ogasawara and M. Tamura
|
Radiation Effects and Defects in Solids 124, 31-41 |
1991 |
Defects Introduced by MeV-Energy Ion Implantation into Si Probed by a Monoenergetic Positron Beam |
A. Uedono, L. Wei, C. Dosho, H. Kondo, S. Tanigawa and M. Tamura
|
Jpn. J. Appl. Phys. 30, 1597-1603 |
1991 |
Release Processes of He Implanted in Cu and Ni Studied by a Monoenergetic Positron Beam |
A. Uedono, S. Tanigawa and H. Sakairi
|
J. Nucl. Mater. 184, 191-196 |
1991 |
Defect Production in Phosphorus Ion-Implanted SiO2(43 nm)/Si Studied by a Variable-Energy Positron Beam |
A. Uedono, L. Wei, C. Dosho, H. Kondo, S. Tanigawa, J. Sugiura and M. Ogasawara
|
Jpn. J. Appl. Phys. 30, 201-206 |
1990 |
Vacancy-Type Defects in As+-Implanted SiO2(43 nm)/Si Probed with Slow Positrons |
A. Uedono, S. Tanigawa, J. Sugiura and M. Ogasawara
|
Jpn. J. Appl. Phys. 29, 1867-1872 |
1990 |
Study of Near Surface Defects in He-Implanted Stainless Steels by Monoenergetic Positron Beam |
A. Uedono, S. Tanigawa and H. Sakairi |
J. Nucl. Mater. 173, 307-312 |
1990 |
Vacancy-type Defects in Si+-Implanted GaAs and Its Effects on Electrical Activation by Rapid Thermal Annealing |
J.-L. Lee, A. Uedono, S. Tanigawa and J. Y. Lee
|
J. Appl. Phys. 67, 6153-6158 |
1990 |
Defects Induced by Wafer Processing and Thermal Treatment in InP Probed with Monoenergetic Positrons |
A. Uedono and S. Tanigawa
|
Jpn. J. Appl. Phys. 29, 909-912 |
1990 |
Characterization of Diamond Films Synthesized on Si from a Gas Phase in Microwave Plasma by Slow Positrons |
A. Uedono, S. Tanigawa, H. Funamoto, A. Nishikawa and K. Takahashi
|
Jpn. J. Appl. Phys. 29, 555-559 |
1989 |
A Study of Vacancy-Type Defects in B+-Implanted SiO2/Si by a Slow Positron Beam |
A. Uedono, S. Tanigawa, J. Sugiura and M. Ogasawara |
Jpn. J. Appl. Phys. 28, 1293-1297 |
1989 |
Depth Profiles of Vacancy-Type Defect in Si+-Implanted GaAs Resulting From Rapid Thermal Annealing |
J.-L. Lee, K.-H Shim, J.S. Kim, H.M. Park, D.S. Ma, S. Tanigawa and A. Uedono
|
J. Appl. Phys. 65, 396-397 |
1985 |
A Study of Agglomeration and Release Processes of Helium Implanted in Nickel by a Variable Energy Positron Beam |
S. Tanigawa, Y. Iwase, A. Uedono and H. Sakairi
|
J. Nucl. Mater. 133&134, 463-467 |
1985 |
$BF1;~Hf3S8!=P$K$h$kM[EE;R>CLG%I%C%W%i!<3H$j$N@:L)B,Dj(J |
$B4d@%5ANQ!$>eEBL@NI!$C+@n>10lO:!$NkLZ7I0&(J
|
Radioisotopes 34, 195-200 |