Year |
Title |
Auther |
Journal/Vol. |
2006 |
Defects in Ga(In)NAs thin films grown by atomic H-assisted molecular beam epitaxy |
Y. Shimizu, Y. Mura, A. Uedono and Y. Okada |
J. Appl. Phys., 100 064910(1-4) |
2006 |
Origin of defect-insensitive emission probability in In-containing (Al,In,Ga)N alloy semiconductors |
S.F. Chichibu,A. Uedono , T. Onuma, B.A. Haskell, A. Chakraborty, T. Koyama, P.T. Fini, S. Keller, S.P. DenBaars, J. S. Speck, U. K. Mishra, S. Nakamura, S. Yamaguchi, S. Kamiyama, H. Amano, I. Akasaki, J. Han and T. Sota |
Nature Materials. doi:10.1038/nmat1726(1-7) |
2006 |
Improvements in quantum efficiency of excitonic emissions in ZnO epilayers by the elimination of point defects |
S. F. Chichibu, T. Onuma, M. Kubota, A. Uedono, T. Sota, A. Tsukazaki, A. Ohtomo and M. Kawasaki |
J. Appl. Phys. 99, 093505(1-6) |
2005 |
Improvement of crystal quality of GaInNAs films grown by atomic hydrogen-assisted RF-MBE |
Y. Shimizu, N. Kobayashi, A. Uedono and Y. Okada |
J. Cryst. Growth 278, 553-557 |
2005 |
Exciton-polariton spectra and limiting factors for the room-temperature photoluminescence efficiency in ZnO |
S.F. Chichibu, A. Uedono, A. Tsukazaki, T. Onuma, M. Zamfirescu, A. Ohtomo, A. Kavokin, G. Gantwell, C. W. Litton, T. Sota and M. Kawasaki |
Semiconductor Science and Technology 20, S67-S77 |
2005 |
Vacancy-type defects in Si-doped InN grown by plasma-assisted molecular beam epitaxy probed using monoenergetic positron beams |
A. Uedono, S. F. Chichibu, M. Higashiwaki, T. Matsui, T. Ohdaira and R. Suzuki |
J. Appl. Phys. 97, 043514(1-5) |
2004 |
Reduction of point defect density in cubic GaN Epilayers on (001) GaAs substrates using AlxGa1-xN/GaN superlattice under layers |
S.F. Chichibu, M. Sugiyama, T. Nozaka, T. Suzuki, T. Onuma, K. Nakajima, T. Aoyama, M. Sumiya, T. Chikyow and A. Uedono |
J. Crystal Growth 272, 481-488 |
2004 |
Direct comparison of photoluminescence lifetime and defect densities in ZnO epilayers studied by time-resolved photoluminescence and slow positron annihilation techniques |
T. Koida, A. Uedono, A. Tsukazaki, T. Sota, M. Kawasaki, and S.F. Chichibu |
Physica Status Solidi (a) 201, pp.2841-2845 |
2004 |
Reduced Defect Densities in Cubic GaN Epilayers with AlGaN/GaN Superlattice Underlayers Grown on (001) GaAs Substrate by Metalorganic Vapor Phase Epitaxy |
M. Sugiyama, T. Nosaka, T. Suzuki, T. Koida, K. Nakajima, T. Aoyama, M. Sumiya, T. Chikyow,A. Uedono , S. F. Chichibu |
Jpn. J. Appl. Phys. 43, 958-965 |
2004 |
Radiative and Nonradiative Processes in Strain-Free AlxGa1-xN Films Studied by Time-Resolved Photoluminescence and Positron Annihilation Techniques |
T. Onuma, S. F. Chichibu, A. Uedono, T. Sota, P. Cantu, T. M. Katona, J. F. Keading S. Keller, U. K. Mishra, S. Nakamura and S. P. DenBaars |
J. Appl. Phys. 95, 2495-2504 |
2003 |
Defects in Eu- and Tb-doped GaN Probed Using a Monoenergetic Positron Beam |
A. Uedono, H. Bang, K. Horibe, S. Morishima and K. Akimoto |
J. Appl. Phys. 93, 5181-5184 |
2003 |
Defects in ZnO Thin Films Grown on ScAlMgO4 Substrates Probed by a Monoenergetic Positron Beam |
A. Uedono, T. Koida, A. Tsukazaki, M. Kawasaki, Z.Q. Chen, SF. Chichibu and H. Koinuma |
J. Appl. Phys. 93, 2481-2485 |
2002 |
Defects-Induced Volume Deviations in ZnSe |
H. Ebe, Z.Q. Chen, A. Uedono, B.P. Zhang, Y. Segawa, K. Suto, and J. Nishizawa |
J. Cryst. Growth 237, 1566-1569 |
2002 |
Defects in Silicon-on-Insulator Wafers and their hydrogen interaction Studied by Monoenergetic Positron Beams |
A. Uedono, Z.Q. Chen, A. Ogura, R. Suzuki, T. Ohdaira and T. Mikado |
J. Appl. Phys. 91, 6488-6492 |
2001 |
Study of Defects in GaN Grown by the Two-Flow Metalorganic Chemical Vapor Deposition Technique Using Monoenergetic Positron Beams |
A. Uedono, S.F. Chichibu, Z.Q. Chen, M. Sumiya, R. Suzuki, T. Ohdaira, T. Mikado, T. Mukai and S. Nakamura |
J. Appl. Phys. 90, 181-186 |
2000 |
Crystallization of an Amorphous Layer in P+-implanted 6H-SiC Studied by Monoenergetic Positron Beams |
A. Uedono, S. Tanigawa, T. Ohshima, H. Itoh, M. Yoshikawa, I. Nashiyama, T. Frank, G. Pensl, R. Suzuki, T. Ohdaira and T. Mikado |
J. Appl. Phys. 87, 4119-4125 |
1999 |
Oxygen-Related Defects in O+-implanted 6H-SiC Studied by a Monoenergetic Positron Beam |
A. Uedono, S. Tanigawa, T. Ohshima, H. Itoh, Y. Aoki, M. Yoshikawa and I. Nashiyama |
J. Appl. Phys. 86, 5392-5398 |