Year |
Title |
Auther |
Journal/Vol. |
2005 |
Limiting factors of room-temperature nonradiative photoluminescence lifetime in polar and nonpolar GaN studied by time-resolved photoluminescence and slow positron annihilation techniques |
S.F. Chichibu, A. Uedono, T. Onuma, T. Sota, B.A. Haskell, S.P. DenBaars, J.S. Speck and S. Nakamura |
Appl. Phys. Lett. 86, 021914(1-3) |
2004 |
Reduced defect densities in the ZnO epilayer grown on Si substrates by laser-assisted molecular-beam epitaxy using a ZnS epitaxial buffer layer |
T. Onuma, S.F. Chichibu, A. Uedono, Y.-Z. Yoo, T. Chikyow, T. Sota, M. Kawasaki and H. Koinuma |
Appl. Phys. Lett. 85, 5586-5588 |
2004 |
Radiative and nonradiative excitonic transitions in nonpolar (11 0) and polar (000 ) and (0001) ZnO epilayers |
T. Koida, S. F. Chichibu,A. Uedon o, T. Sota, A. Tsukazaki and M. Kawasaki |
Appl. Phys. Lett. 84, 1079-1081 |
2003 |
Correlation between the photoluminescence lifetime and defect density in bulk and epitaxial ZnO |
T. Koida, S. F. Chichibu,A. Uedono, A. Tsukazaki, M. Kawasaki, T. Sota, Y. Segawa and H. Koinuma |
Appl. Phys. Lett. 82, 532-534 |
2001 |
Impact of growth polar direction on the optical properties of GaN grown by metalorganic vapor phase epitaxy |
S.F. Chichibu, A. Setoguchi, A. Uedono, K. Yoshimura and M. Sumiya |
Appl. Phys. Lett. 78, 28-30 |
1994 |
Defects introduced by Ar plasma exposure in GaAs probed by monoenergetic positron beam |
A. Uedono, T. Kawano, S. Tanigawa, K. Wada and H. Nakanishi |
Jpn. J. Appl. Phys. 33, L1374-L1377 |
1991 |
Effects of the Fermi Level on Defects in Be+-Implanted GaAs Studied by a Monoenergetic Positron Beam |
A. Uedono, L. Wei, Y. Tabuki, H. Kondo, S. Tanigawa, K. Wada and H. Nakanishi |
Jpn. J. Appl. Phys. 30, L2002-L2005 |
1990 |
Positron Study of Vacancy-Type Defects Induced by Heavy Doping into MBE-Grown GaAs |
A. Uedono and S. Tanigawa |
Jpn. J. Appl. Phys. 29, L346-L348 |
1988 |
Depth Profiles of Ion-Implantation Induced Vacancy-Type Defects in GaAs and Si Observed by Slow Positron |
) J.-L. Lee, J.S. Kim, H.M. Park, D.S. Ma, S. Tanigawa and A. Uedono |
Appl. Phys. Lett. 53, 1302-1304 |